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  • Главная
  • 2025
  • Cryo-electron Tomography: A Journey from Sample Preparation to Data Mining
Cryo-electron Tomography: A Journey from Sample Preparation to Data Mining 1 Cryo-electron Tomography: A Journey from Sample Preparation to Data Mining 1
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Cryo-electron Tomography: A Journey from Sample Preparation to Data Mining

Description

English | 2025 | PDF | 14 MB | 268 Pages

Dorit Hanein, 9780443188305, 978-0443188305, 0443188300, 0443188297, B0DQP1PP1S, 9780443188299, 978-0443188299, 978-0-443-18829-9
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